OmniScan™ X3

Each flaw detector in the OmniScan™ X3 series is a comprehensive phased array solution. Equipped with cutting-edge Total Focusing Method (TFM) and advanced Phased Array (PA) features, it ensures precise flaw detection with confidence. User-friendly software and streamlined workflows enhance efficiency, helping you achieve greater productivity.

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Category: UT & PAUT Flaw Detectors

Description
Brochure

Description

Each flaw detector in the OmniScan™ X3 series is a comprehensive phased array solution. Equipped with cutting-edge Total Focusing Method (TFM) and advanced Phased Array (PA) features, it ensures precise flaw detection with confidence. User-friendly software and streamlined workflows enhance efficiency, helping you achieve greater productivity.

OmniScan™ X3

Each flaw detector in the OmniScan™ X3 series is a comprehensive phased array solution.

Overview of Phased Array Ultrasonic Testing (PAUT)

Overview of PAUT

Phased Array Ultrasonic Testing (PAUT) is an advanced NDE technique that uses a set of ultrasonic testing probes to detect cracks in process equipment.

Brochure

Download the OmniScan X3 64 Brochure